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Advanced Semiconductor Device Lab.

Professor

  • Professor Jongtae Ahn

Available Equipment

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No. 1
Optical microscope
Location
  • Room 104, Building 98 (Global Lifelong Learning Center)
Specifications
  • Magnification range: 100× to 1000×, bright field/dark field.
Description
  • A microscope that visually magnifies micro-sized objects.
Applications
  • Optical imaging of 2D semiconductor electrons and semiconductor devices, etc.
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No. 2
Parameter analyzer
Location
  • Room 104, Building 98 (Global Lifelong Learning Center)
Specifications
  • 10aA – 1A, 0.2µV – 210V, ±40V(80V p-p), ±800mA 200MSa/sec, 5ns 샘플링 레이트
Description
  • Equipment for analyzing the electrical properties of semiconductor devices.
Applications
  • Measurement of I-V and C-V characteristics of semiconductor devices.
  • Photocurrent measurement of optoelectronic devices.
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No. 3
MST5500B
Location
  • Room 104, Building 98 (Global Lifelong Learning Center)
Specifications
  • 4 Micro positioner, dark shield box
Description
  • Physical contact is established to measure the electrical properties of semiconductor devices.
Applications
  • Measurement of I-V and C-V characteristics of semiconductor devices.
  • Photocurrent measurement of optoelectronic devices.
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No. 4
Mask Aligner
Location
  • Room 104, Building 98 (Global Lifelong Learning Center)
Specifications
  • ~5 µm resolution.
Description
  • A mask alignment system for photolithography exposure.
Applications
  • photolithography

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